TitleNoise Properties Of Thick-Film Conducting Lines For Integrated Inductors
Journal titleMetrology and Measurement Systems
Keywordslow-frequency noise ; thick-film conducting layer ; thick-film inductor
Divisions of PASNauki Techniczne
PublisherPolish Academy of Sciences Committee on Metrology and Scientific Instrumentation
Date2015[2015.01.01 AD - 2015.12.31 AD]
TypeArtykuły / Articles
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