Details Details PDF BIBTEX RIS Title Distribution of potential barrier height local values at Al-SiO2 and Si-SiO2 interfaces of the metal-oxide-semiconductor structures Journal title Bulletin of the Polish Academy of Sciences: Technical Sciences Yearbook 2006 Volume vol. 54 Numer No 4 Authors Piskorski, K. ; Przewlocki, H.M. Keywords barrier height ; effective contact potential difference ; MOS system Divisions of PAS Nauki Techniczne Coverage 461-468 Date 2006 Type Artykuły / Articles Identifier ISSN 2300-1917