TY - JOUR
N2 - Nowadays a geometrical surface structure is usually evaluated with the use
of Fourier transform. This type of transform allows for accurate analysis
of harmonic components of surface profiles. Due to its fundamentals,
Fourier transform is particularly efficient when evaluating periodic
signals. Wavelets are the small waves that are oscillatory and limited in
the range. Wavelets are special type of sets of basis functions that are
useful in the description of function spaces. They are particularly useful
for the description of non-continuous and irregular functions that appear
most often as responses of real physical systems. Bases of wavelet
functions are usually well located in the frequency and in the time
domain. In the case of periodic signals, the Fourier transform is still
extremely useful. It allows to obtain accurate information on the analyzed
surface. Wavelet analysis does not provide as accurate information about
the measured surface as the Fourier transform, but it is a useful tool for
detection of irregularities of the profile. Therefore, wavelet analysis is
the better way to detect scratches or cracks that sometimes occur on the
surface. The paper presents the fundamentals of both types of transform.
It presents also the comparison of an evaluation of the roundness profile
by Fourier and wavelet transforms.
JO - Metrology and Measurement Systems
L1 - http://so.czasopisma.pan.pl/Content/107051/PDF/Journal10178-VolumeXVII+Issue2_08+paper.pdf
L2 - http://so.czasopisma.pan.pl/Content/107051
PY - 2010
IS - No 2
KW - wavelet
KW - Fourier transform
KW - geometrical surface structure
A1 - Stępień, Krzysztof
A1 - Makieła, Włodzimierz
A1 - Adamczak, Stanisław
PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation
JF - Metrology and Measurement Systems
T1 - Investigating Advantages and Disadvantages of the Analysis of a Geometrical Surface Structure with the Use of Fourier and Wavelet Transform
DA - 2010
UR - http://so.czasopisma.pan.pl/dlibra/docmetadata?id=107051
DOI - 10.2478/v10178-010-0020-x
ER -